DART: Dynamic Repair for Interconnect Fault Tolerance in Hybrid Bonding
Published in 2026 IEEE 44th VLSI Test Symposium (VTS), 2026
DART uses non-uniform, irregular repair chains and multi-objective heuristic optimization to tolerate clustered and line-shaped interconnect defects with minimal rerouting overhead.
Recommended citation: Partho Bhoumik, Zhichao Chen, Puneet Gupta, and Krishnendu Chakrabarty. (2026). "DART: Dynamic Repair for Interconnect Fault Tolerance in Hybrid Bonding." 2026 IEEE 44th VLSI Test Symposium (VTS).
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